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Observed Behavior When a short Device Self‑Test (DST) is started, the following symptoms may appear if the DST log (Log ID 0x06) is accessed within the first 2 seconds: Short DST reports a failure. Incorrect data is evaluated during segment testing, resulting in a failing test result.
Root Cause of Short DST Failure on Micron 9550 E1.S SSDs Timing‑Sensitive DST Log Access When a short Device Self‑Test (DST) is initiated, accessing the DST log (Log ID 0x06) within the first 2 seconds can trigger a failure. The firmware uses an internal pointer to reference a structured memory area during the DST. During the brief window after the short DST starts, the pointer is incorrectly set. This incorrect pointer is used in one of the segment tests, causing the test to evaluate wrong data. The result is a failing DST, even though the SSD hardware is functional. Firmware Defect The issue originates from earlier firmware versions that do not correctly initialize the pointer value during the short DST sequence.
Update Micron 9550 E1.S SSD Firmware to Resolve Short DST Failure. Prerequisites Identify affected SSDs (Micron 9550 E1.S) installed in PowerEdge servers. Affected Dell part numbers are, HRF8G, 2G1RR. Download the Micron firmware package F3MU100 from the official site: https://www.micron.com/products/storage/ssd/micron-ssd-firmware#accordion-e6c186b05b-item-9043f824b1 (External Link) For any system affected by this issue, an error log entry indicating a Segmentation Fault (Seg Fault) will appear in the drive self-test log. This log maintains records of the last 20 DST test runs. After the firmware update, once 20 subsequent DST tests have been completed, the Seg Fault entry will no longer appear in the log.
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